Frequently used abbreviations of sensor technologies in general

This chapter explains common abbreviations, for example abbreviations connected to the lifetime, which are frequently used in the sensor division.


Electrostatic discharge: Through improper handling the ESD can cause detector damage.


Mean time to failure, which measures average time to failures with the modeling assumption that the failed system is not repaired. For InfraTec’s single and dual channel detectors the MTTF amounts more than 300 years, for quad channel detectors about 100 years.


Non Dispersive Infrared Radiation.


Transistor Outline: Specifies a transistor's package, see figure.